CAMECA®’s EIKOS-UV™ atom probe was introduced this year at Microscopy and Microanalysis in St. Louis, USA. The simplified design and smaller footprint make it easier for anyone to include atom probe tomography as a part of their routine materials characterization suite. The energy-compensated flightpath provides excellent mass resolving power and signal-to-noise to the voltage-pulse-mode, while the laser-mode design allows, for the first time, a fully functional atom probe to be set up and operate at full specification, even on a conference trade show floor.
In this study, a 355 nm (UV) ~1 ns pulse-duration fiber-based laser source (EIKOS-UV) is compared with a similar 532 nm laser (EIKOS-X, green). Previous work reported on the LEAP® systems demonstrated improved spectral quality and yield achieved with shorter wavelength laser pulsing. The EIKOS platform design enables integration of different laser sources, and a UV-laser system that meets power, beam quality, and form factor requirements for EIKOS is now available, bringing greater performance and range of applications to the simplified design.