Magnus Garbrecht 26th ACMM “2020 Visions in Microscopy”

Magnus Garbrecht

Following his studies of physics at the Christian-Albrechts University Kiel (Germany), Magnus Garbrecht has operated aberration-corrected TEMs since his time as PhD student (2005-2008), where he employed the world’s first image-corrected FEI Titan instrument at the Ernst Ruska-Centre of the Research Centre Jülich for determination of ultimate precision limits of atomic column position determination in complex intercalation compounds. Afterwards he joined the Faculty of Materials Science and Engineering at the Technion in Haifa, Israel as a postdoctoral fellow for 3 years, operating their monochromated and aberration corrected TEM for projects in the fields of metal-ceramics interfaces, semiconductors, and functional nanostructures. In 2012 he joined Linköping University, Sweden, following the acquisition of a double-corrected TEM, and later became appointed Assistant Professor and Senior lecturer in 2015, investigating growth and properties of thin films for coatings and electrical applications. In 2018, he became appointed to the role as TEM section manager within Sydney Microscopy & Microanalysis at The University of Sydney.