Joanne Etheridge 26th ACMM “2020 Visions in Microscopy”

Abstracts this author is presenting:

• Direct exit wave retrieval from a single diffraction pattern via straight edge apertures — Concurrent Session F2 Diffraction and Imaging Techniques
• Symmetry-STEM:  Symmetry-derived atomic resolution imaging — Concurrent Session F2 Diffraction and Imaging Techniques