Richard Wuhrer 26th ACMM “2020 Visions in Microscopy”

Abstracts this author is presenting:

• WDS(SD) - Reasons Why to Replace the Proportional Counter (PC) in a Wavelength Dispersive Spectrometer (WDS) with a Silicon Drift Detector (SDD)  — Concurrent Session D1 SEM analysis I - EDS and CL
• Composite Cladding Materials – Microscopy, Microanalysis, FTIR, XRD and Thermal Analysis Investigation — Poster Session 2