Eiji Okunishi 26th ACMM “2020 Visions in Microscopy”

Abstracts this author is presenting:

• Mapping for atomic-site-specific oxidation states of metal atoms by EELS with STEM-moiré method — Concurrent Session D5 EELS/EDX high energy spectroscopy
• Improving xray detection efficiency using newly designed objective lens polepiece for aberration corrected 300 kV microscope — Vendors Session