Hanfang Hao 26th ACMM “2020 Visions in Microscopy”

Abstracts this author is presenting:

• Multi-modal Microscopy for advanced imaging and analysis of Lithium-ion Batteries — Concurrent Session E7 TEM Analysis
• High Throughput Imaging and Analysis in 3D using a Femtosecond Laser Integrated with a Gallium Crossbeam — Poster Session 2
• Exploration and characterization of nano-features with the ORION NanoFab-SIMS — Poster Session 2